TE Connectivity AMP Connectors 11586 Pin Headers Series

7 variants · TE Connectivity AMP ConnectorsAll Pin Headers →

About the TE Connectivity AMP Connectors 11586 Pin Headers Series

IC Source Direct is a China connector distributor, supplier and independent procurement agent for TE Connectivity AMP Connectors 11586 Pin Headers Series components, matching housing, contact and mating cycles across the Shenzhen interconnect channel. The TE Connectivity AMP Connectors 11586 Pin Headers Series series groups 7 related part numbers, each listed with full specifications, a datasheet where available, and an RFQ option. Every variant in the range shares a common applications of General Purpose, Industrial, Lighting, connector type of Header and contact finish - mating of Tin. Variants differ by material flammability rating, package and positions, so you can match the exact material flammability rating your application requires using the selection guide below. All listed TE Connectivity AMP Connectors 11586 Pin Headers Series part numbers are active and orderable.

Select a variant by

Material flammability rating: UL94 V-0 · UL94 V-2
Package: Bulk · Tray
Positions: 10 · 12 · 14 · 16 · 18

Shared specifications

Applications: General Purpose, Industrial, Lighting
Connector type: Header
Contact finish - mating: Tin
Contact finish - post: Tin
Contact finish thickness - mating: 80.0µin (2.03µm)
Contact finish thickness - post: 80.0µin (2.03µm)
Contact length - post: 0.138\" (3.50mm)
Contact material: Brass Alloy
Contact shape: Square
Current rating: 9A
Fastening type: Locking Ramp
Insulation color: Natural

Variant comparison

Parameter	1-1586037-2	1-1586037-4	1-1586037-6	1-1586038-0	1-1586038-2	1-1586038-4
Material flammability rating	UL94 V-2	UL94 V-2	UL94 V-2	UL94 V-0	UL94 V-0	UL94 V-0
Package	Bulk	Bulk	Bulk	Tray	Tray	Tray
Positions	12	14	16	10	12	14

Request a quote on any TE Connectivity AMP Connectors 11586 Pin Headers Series part number and we confirm price, availability and lead time per line — including end-of-life and allocation-constrained variants.